Overview
The materials engineering electron microscopy & characterization laboratory exists to provide access and training that enables our students and researchers to unlock new understanding of materials and how we make them. To achieve this goal, we provide access to a suite of high quality instrumentation and provide training for our users, as well as supporting the undergraduate curriculum in materials engineering.
The laboratory is set up with a few major instrument and equipment clusters: (1) scanning electron microscopes, equipped with analytical capabilities; (2) X-ray diffraction; (3) sample preparation equipment. The lab is staffed by a full time technician, Heli Eunike, and is supported academically by many faculty members in the Department of Materials Engineering. A Faculty point of contact for the lab is Dr Ben Britton.
Scanning Electron Microscopes
In brief, a scanning electron microscope scan a highly focused electron beam across the surface of a sample. At each point, signals are collected and micrographs can be created. These micrographs (aka images) can be used to understand the structure, morphology, chemistry and microstructure of a well prepared material. The (relatively) small sample is held under vacuum and typically must be reasonable conductive for analysis. Surface topography can be evaluated through analysis of secondary electron and topographical backscatter electron micrographs. Chemistry can be analysis using compositional backscatter electron micrographs and energy dispersive X-ray spectroscopy.
For further information on the basics of scanning electron microscopy, we recommend the following resources: MyScope – Training Materials; Principles of Scanning Electron Microscopy – Thermo Fisher Scientific; and a brief lecture captured on YouTube by Dr Britton.
FEI Quanta 650 with large area EDX
The FEI Quanta 650 is a large chamber Tungsten hairpin filament SEM with environmental imaging capability. Environmental imaging allows for imaging and elemental analysis of uncoated non-conductive specimens. Properly equipped, liquid water can be imaged, but not as the machine is currently configured. The system is equipped with a backscatter detector as well as a full EDX analysis system with a large area detector. The EDX system can be used to analyze polished samples quantitatively in conjunction with appropriate standards. The EDX software can also be configured for automated particle detection and analysis.
Thermo Fisher Scientific Phenom XL GL2
The Phenom XL GL2 is a table top scanning electron microscope, equipped with an integrated optical microscope (for sample finding) and CeB6 source. Micrographs can be captured using secondary or backscatter electron detectors, with a resolution of <10 nm. For chemical analysis, this is also equipped with a built in energy dispersive X-ray spectrometer for basic EDX analysis, and the ChemiSEM technique. The instrument also is equipped with the MAPS 3 platform from Thermo Fisher Scientific which enables very large area mapping and correlative multi-modal microscopy. The instrument can operate with a variety of accelerating voltages (5-15 kV) and at low and high vacuum. This instrument can be transported to other sites, e.g. for outreach and public engagement. The instrument data sheet can be found here.
This instrument is incredibly easy to use, and most users can quickly be up and running and collecting data with very minimal training.
Hitachi S3000N VP-SEM with EDX
The Hitachi S3000N is a conventional Tungsten hairpin filament source SEM with variable pressure capability. Variable pressure allows for imaging and elemental analysis of uncoated non-conductive specimens. The system is equipped with a backscatter detector as well as a full EDX analysis system.
Sample Preparation
Edwards 306 Evaporator
The Edwards 306 is a general high vacuum evaporation and coating system. In the EM laboratory, it is primarily used for the coating of samples with carbon prior to elemental analysis.
Edwards S150A Sputter Coater
The Edwards S150A is a general purpose low vacuum sputter coater. It is used for providing a conductive coating for non-conductive samples to aid in imaging.