FEI Quanta 650 with large area EDX
The FEI Quanta 650 is a large chamber Tungsten hairpin filament SEM with environmental imaging capability. Environmental imaging allows for imaging and elemental analysis of uncoated non-conductive specimens. Properly equipped, liquid water can be imaged, but not as the machine is currently configured. The system is equipped with a backscatter detector as well as a full EDX analysis system with a large area detector. The EDX system can be used to analyze polished samples quantitatively in conjunction with appropriate standards. The EDX software can also be configured for automated particle detection and analysis.
Hitachi S3000N VP-SEM with EDX
The Hitachi S3000N is a conventional Tungsten hairpin filament source SEM with variable pressure capability. Variable pressure allows for imaging and elemental analysis of uncoated non-conductive specimens. The system is equipped with a backscatter detector as well as a full EDX analysis system.
Rigaku MultiFlex XRD
The Rigaku MultiFlex is a single axis x-ray diffractometer equipped with a 2kW x-ray generator. The system is equipped with a monochromator and scintillation counter detector. This configuration allows for the analysis of materials may fluoresce and cause difficulties in other systems. The system is configured for powder samples, but wide variety of holders for solid samples are available. Also available is a high temperature stage accessory for the study of temperature variations on materials.
Edwards 306 Evaporator
The Edwards 306 is a general high vacuum evaporation and coating system. In the EM laboratory, it is primarily used for the coating of samples with carbon prior to elemental analysis.
Edwards S150A Sputter Coater
The Edwards S150A is a general purpose low vacuum sputter coater. It is used for providing a conductive coating for non-conductive samples to aid in imaging.
